发明授权
- 专利标题: Double-gate transistor with enhanced carrier mobility
- 专利标题(中): 具有增强的载流子迁移率的双栅晶体管
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申请号: US10463080申请日: 2003-06-16
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公开(公告)号: US06974733B2公开(公告)日: 2005-12-13
- 发明人: Boyan Boyanov , Brian Doyle , Jack Kavalieros , Anand Murthy , Robert Chau
- 申请人: Boyan Boyanov , Brian Doyle , Jack Kavalieros , Anand Murthy , Robert Chau
- 申请人地址: US CA Santa Clara
- 专利权人: Intel Corporation
- 当前专利权人: Intel Corporation
- 当前专利权人地址: US CA Santa Clara
- 代理机构: Blakely, Sokoloff, Taylor and Zafman
- 主分类号: H01L21/336
- IPC分类号: H01L21/336 ; H01L29/10 ; H01L29/78 ; H01L21/338
摘要:
There is disclosed an apparatus including a straining substrate, a device over the substrate including a channel, wherein the straining substrate strains the device in a direction substantially perpendicular to a direction of current flow in the channel.
公开/授权文献
- US20040253774A1 Double-gate transistor with enhanced carrier mobility 公开/授权日:2004-12-16
信息查询
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