发明授权
- 专利标题: Application of statistical inference to optical time domain reflectometer data
- 专利标题(中): 统计推理应用于光时域反射计数据
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申请号: US10897929申请日: 2004-07-23
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公开(公告)号: US06989893B1公开(公告)日: 2006-01-24
- 发明人: Michael Asher , Hossein Eslambolchi , Chuck Giddens , John Sinclair Huffman , Harold Stewart
- 申请人: Michael Asher , Hossein Eslambolchi , Chuck Giddens , John Sinclair Huffman , Harold Stewart
- 申请人地址: US NY New York
- 专利权人: AT&T Corp.
- 当前专利权人: AT&T Corp.
- 当前专利权人地址: US NY New York
- 主分类号: G01N21/00
- IPC分类号: G01N21/00
摘要:
The present invention relates to method for interpreting data obtained by measuring a length of optical fiber using an optical time domain reflectometer (OTDR), and comparing that measurement to a reference measurement. The technique uses statistical inference to determine a likely cause for a length measurement to be shorter than a reference length. One technique uses a chi-squared best fit of an array reflectance spike occurrences along the fiber to a historical reference array. In that way, it can be determined whether the missing portion of the tested fiber is at an end or between the ends, providing evidence that the short length measurement results from a fiber break or from the intentional removal of a reserve loop.
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