Application of statistical inference to optical time domain reflectometer data
    4.
    发明授权
    Application of statistical inference to optical time domain reflectometer data 有权
    统计推理应用于光时域反射计数据

    公开(公告)号:US07256878B1

    公开(公告)日:2007-08-14

    申请号:US11434357

    申请日:2006-05-15

    IPC分类号: G01N21/00

    CPC分类号: G01M11/3145

    摘要: The present invention relates to a method for interpreting data obtained by measuring a length of optical fiber using an optical time domain reflectometer (OTDR), and comparing that measurement to a reference measurement. The technique uses statistical inference to determine a whether a reference trace is valid by comparing that trace to a more recent test trace. One technique uses a chi-squared best fit of an array reflectance spike occurrences along the fiber to a historical reference array.

    摘要翻译: 本发明涉及一种用于解释通过使用光时域反射计(OTDR)测量光纤的长度获得的数据的方法,并将该测量与参考测量进行比较。 该技术使用统计推断来通过将该跟踪与更新的测试跟踪进行比较来确定参考跟踪是否有效。 一种技术使用沿着光纤的阵列反射峰值发生的奇偶校验最佳拟合到历史参考阵列。

    Application of statistical inference to optical time domain reflectometer data
    5.
    发明授权
    Application of statistical inference to optical time domain reflectometer data 失效
    统计推理应用于光时域反射计数据

    公开(公告)号:US06989893B1

    公开(公告)日:2006-01-24

    申请号:US10897929

    申请日:2004-07-23

    IPC分类号: G01N21/00

    CPC分类号: G01M11/3145

    摘要: The present invention relates to method for interpreting data obtained by measuring a length of optical fiber using an optical time domain reflectometer (OTDR), and comparing that measurement to a reference measurement. The technique uses statistical inference to determine a likely cause for a length measurement to be shorter than a reference length. One technique uses a chi-squared best fit of an array reflectance spike occurrences along the fiber to a historical reference array. In that way, it can be determined whether the missing portion of the tested fiber is at an end or between the ends, providing evidence that the short length measurement results from a fiber break or from the intentional removal of a reserve loop.

    摘要翻译: 本发明涉及用于解释通过使用光时域反射计(OTDR)测量光纤的长度获得的数据的方法,并将该测量与参考测量进行比较。 该技术使用统计推断来确定长度测量的可能原因要比参考长度短。 一种技术使用沿着光纤的阵列反射峰值发生的奇偶校验最佳拟合到历史参考阵列。 以这种方式,可以确定测试的纤维的缺失部分是在端部还是端部之间,提供证据表明短纤维断裂导致短纤维断裂或有意去除保留环路。