发明授权
- 专利标题: Magnetic semiconductor memory device
- 专利标题(中): 磁性半导体存储器件
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申请号: US10715448申请日: 2003-11-19
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公开(公告)号: US07002831B2公开(公告)日: 2006-02-21
- 发明人: Hideyuki Matsuoka , Kenchi Ito , Takeshi Sakata , Kiyoo Itoh
- 申请人: Hideyuki Matsuoka , Kenchi Ito , Takeshi Sakata , Kiyoo Itoh
- 申请人地址: JP Tokyo
- 专利权人: Renesas Technology Corp.
- 当前专利权人: Renesas Technology Corp.
- 当前专利权人地址: JP Tokyo
- 代理机构: Miles & Stockbridge PC
- 优先权: JPP2002-345530 20021128
- 主分类号: G11C17/02
- IPC分类号: G11C17/02
摘要:
A memory cell in a so-called MRAM by utilizing a tunnel magnetic resistance in the prior art has raised problems that a magnetic field to be applied to a TMR element is essentially weak since a word line for write is disposed apart from the TMR element, that a large current is required at the time of a writing operation, and that electric power consumption is large. In order to solve the above-described problems experienced in the prior art, the present invention provides an MRAM memory cell structure and its fabricating method in which a word line for write is disposed near a TMR element and surrounds it in three directions.
公开/授权文献
- US20040105326A1 Magnetic semiconductor memory device 公开/授权日:2004-06-03
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