发明授权
US07019548B2 Laser production and product qualification via accelerated life testing based on statistical modeling 失效
激光生产和产品鉴定通过加速寿命测试基于统计建模

Laser production and product qualification via accelerated life testing based on statistical modeling
摘要:
A method is provided for improving performance testing in semiconductor lasers via an accelerated life model. By using an accelerated life model, operating conditions for performance tests, such as burn-in procedures and wafer qualification, are optimized with reduced cost and effort. The method is also used to improve maintenance of optical networks containing semiconductor lasers.
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