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    Screening optical transceiver modules for electrostatic discharge damage
    1.
    发明授权
    Screening optical transceiver modules for electrostatic discharge damage 有权
    屏蔽用于静电放电损坏的光收发模块

    公开(公告)号：US07440865B1

    公开(公告)日：2008-10-21

    申请号：US10771083

    申请日：2004-02-03

    申请人： Rudolf J. Hofmeister ,  Song Miao ,  Andreas Weber ,  William Freeman

    发明人： Rudolf J. Hofmeister ,  Song Miao ,  Andreas Weber ,  William Freeman

    IPC分类号： G01R27/28 ,  H04B10/00

    CPC分类号： G01R31/002 ,  G01R31/2635

    摘要： A general method is given for screening laser diodes for electrostatic discharge, (ESD), damage. The laser diode may be selectively isolated from the laser driver so that a current-voltage (I-V), curve can be taken and then compared to curves taken previously on the same laser diode to ascertain the possibility of ESD damage. Presumably the initial I-V curve will be representative of the characteristics of that particular laser in the undamaged state. Such an initial curve may be supplied by the manufacturer and may be a curve specific to a particular laser diode. Comparison with a standard curve is not sufficient to determine ESD damage in the early stages of failure. Some embodiments focus on isolating the laser diode from the laser driver, storing the information locally in the transceiver, and providing some analysis resulting in flagging laser diodes showing changes that are indicative of ESD damage.

    摘要翻译： 给出了用于屏蔽激光二极管静电放电（ESD），损坏的一般方法。 激光二极管可以选择性地与激光驱动器隔离，使得可以采用电流 - 电压（I-V）曲线，然后将其与先前在同一激光二极管上获得的曲线进行比较，以确定ESD损坏的可能性。 可能的是，初始的I-V曲线将代表在未损坏状态下该特定激光器的特性。 这样的初始曲线可以由制造商提供，并且可以是特定于特定激光二极管的曲线。 与标准曲线的比较不足以确定故障早期的ESD损伤。 一些实施例集中于将激光二极管与激光驱动器隔离，将信息本地存储在收发器中，并提供一些分析，导致标记激光二极管，显示出表示ESD损坏的变化。

    Valuation of tester accuracy
    4.
    发明授权
    Valuation of tester accuracy 失效
    测量仪精度估值

    公开(公告)号：US06553522B1

    公开(公告)日：2003-04-22

    申请号：US09510101

    申请日：2000-02-22

    申请人： Wajih Dalal ,  Song Miao

    发明人： Wajih Dalal ,  Song Miao

    IPC分类号： G01R3128

    CPC分类号： G01R31/31922 ,  G01R31/319 ,  G01R31/31937

    摘要： Tester edge placement accuracy (EPA) is important for testing of semiconductor component devices. The value of that accuracy is quantified to the device manufacturer in terms of yield loss and bad parts sold as good parts (escapes in DPM). A simulation is presented that models the tester accuracy, the device edge distribution and their interaction for a example device having an operating speed of 800 Mbps. The same model can be applied for microprocessors or other parts that operate near the limits of ATE performance. In an example given, the estimated losses due to lack of appropriate tester accuracy are considerable: with the estimated yields and selling prices for the example device, the model shows a value of over $1 M for every 1 ps of enhanced tester edge placement accuracy.

    摘要翻译： 测试仪边缘放置精度（EPA）对于半导体组件设备的测试非常重要。 关于产量损失和销售成本不佳的零件（DPM中逃逸），该精度的价值量化到设备制造商。 提出了一种模拟测试仪精度，设备边缘分布及其与800 Mbps工作速度的示例设备的交互。 相同的型号可以应用于微处理器或其他靠近ATE性能极限运行的部件。 在一个示例中，由于缺乏适当的测试仪精度而导致的估计损失是相当可观的：对于示例设备的估计产量和销售价格，该模型显示每增加1ps的增强测试仪边缘放置精度超过1M的值。

    Laser production and product qualification via accelerated life testing based on statistical modeling
    6.
    发明授权
    Laser production and product qualification via accelerated life testing based on statistical modeling 失效
    激光生产和产品鉴定通过加速寿命测试基于统计建模

    公开(公告)号：US07019548B2

    公开(公告)日：2006-03-28

    申请号：US11138602

    申请日：2005-05-26

    申请人： Song Miao ,  Chun Lei ,  Raj Cornelius ,  Alex Klajic

    发明人： Song Miao ,  Chun Lei ,  Raj Cornelius ,  Alex Klajic

    IPC分类号： G01R31/26

    CPC分类号： G01R31/2642 ,  G01R31/2635 ,  H01S5/0014

    摘要： A method is provided for improving performance testing in semiconductor lasers via an accelerated life model. By using an accelerated life model, operating conditions for performance tests, such as burn-in procedures and wafer qualification, are optimized with reduced cost and effort. The method is also used to improve maintenance of optical networks containing semiconductor lasers.

    摘要翻译： 提供了一种通过加速寿命模型改善半导体激光器性能测试的方法。 通过使用加速寿命模型，优化了性能测试的操作条件，如老化程序和晶片鉴定，降低了成本和精力。 该方法还用于改善包含半导体激光器的光网络的维护。