发明授权
- 专利标题: Substrate mapping
-
申请号: US10792230申请日: 2004-03-03
-
公开(公告)号: US07022533B2公开(公告)日: 2006-04-04
- 发明人: Warren M. Farnworth , Derek J. Gochnour
- 申请人: Warren M. Farnworth , Derek J. Gochnour
- 申请人地址: US ID Boise
- 专利权人: Micron Technology, Inc.
- 当前专利权人: Micron Technology, Inc.
- 当前专利权人地址: US ID Boise
- 代理机构: TraskBritt
- 主分类号: G01R31/26
- IPC分类号: G01R31/26 ; H01L21/66
摘要:
A method for fabricating semiconductor die packages including a mounting substrate and dice attached thereto. The mounting substrate includes multiple die attach sites and a designator having substrate identification information. The die attach sites are evaluated and categorized as either good or defective die attach sites, wherein the evaluated information is saved in an electronic file as mapped information. A die is attached to the die attach sites in accord with the information, wherein known good dice are attached to the good die attach sites and known defective dice are attached to the defective die attach sites. The assembly is then encapsulated in a transfer molding operation.
公开/授权文献
- US20040171179A1 Substrate mapping 公开/授权日:2004-09-02
信息查询