发明授权
- 专利标题: Structure analysis and defect detection system
- 专利标题(中): 结构分析与缺陷检测系统
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申请号: US10605994申请日: 2003-11-12
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公开(公告)号: US07027136B2公开(公告)日: 2006-04-11
- 发明人: John C. Tsai , David W. Wang
- 申请人: John C. Tsai , David W. Wang
- 申请人地址: US CA Santa Clara
- 专利权人: Fibera, Inc.
- 当前专利权人: Fibera, Inc.
- 当前专利权人地址: US CA Santa Clara
- 代理机构: Intellectual Property Law Offices
- 代理商 Raymond E. Roberts
- 主分类号: G01N21/00
- IPC分类号: G01N21/00
摘要:
A structure analysis and defect detection system in which a laser light source provides light via optical fiber to fiber Bragg gratings that change resonant frequency as stresses change in the structure. Light at the resonant frequencies of the fiber Bragg gratings is reflected and light of other frequencies is passed. The respective reflected light is directed through a Fabry-Perot interference filter or a fiber interferometer and detected by a photodetector. If the Fabry-Perot interference filter is used, the intensity of the reflected light indicates current stress at a fiber Bragg grating. If the fiber interferometer is used, a beat frequency due to heterodyne interference in the light indicates current stress at the respective fiber Bragg grating. Comparison data for the respective characteristic in the detected light over time permits stress analysis, and comparison of such data with pre-determined limit values permits defect or failure detection.
公开/授权文献
- US20040149897A1 STRUCTURE ANALYSIS AND DEFECT DETECTION SYSTEM 公开/授权日:2004-08-05
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