Invention Grant
- Patent Title: Optical technique for detecting buried defects in opaque films
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Application No.: US10423354Application Date: 2003-04-25
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Publication No.: US07027142B2Publication Date: 2006-04-11
- Inventor: Daniel Some
- Applicant: Daniel Some
- Applicant Address: IL Rehovot
- Assignee: Applied Materials, Israel, Ltd.
- Current Assignee: Applied Materials, Israel, Ltd.
- Current Assignee Address: IL Rehovot
- Agent Tarek N. Fahmi
- Main IPC: G01N21/00
- IPC: G01N21/00

Abstract:
A local area of a sample is focally heated to produce a transient physical deformation. The surface of the structure is optically monitored while the heated area cools to a baseline temperature by illuminating the heated region with one or more probe beams from time to time and detecting returning light. In some embodiments heat dissipation within the structure is correlated with change in optical reflectivity over time. In other embodiments, surface deformation of the structure is correlated with changes in light scattering from the surface. Following application of a pump pulse and no more than 3 probe pulses, a time varying returning light signal is compared with a corresponding returning light signal from a reference. An anomaly in the sample is indicated by a deviation between the two signals. First-degree exponential decay curves may be constructed from the signals, and their decay constants compared.
Public/Granted literature
- US20030206292A1 Optical technique for detecting buried defects in opaque films Public/Granted day:2003-11-06
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