发明授权
- 专利标题: Transmission electron microscope system and method of inspecting a specimen using the same
- 专利标题(中): 透射电子显微镜系统及使用其的检查方法
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申请号: US10918340申请日: 2004-08-16
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公开(公告)号: US07034299B2公开(公告)日: 2006-04-25
- 发明人: Ryo Nakagaki , Yuji Takagi , Hirohito Okuda , Hiroshi Kakibayashi
- 申请人: Ryo Nakagaki , Yuji Takagi , Hirohito Okuda , Hiroshi Kakibayashi
- 申请人地址: JP Tokyo
- 专利权人: Hitachi High-Technologies Corporation
- 当前专利权人: Hitachi High-Technologies Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: Antonelli, Terry, Stout and Kraus, LLP.
- 优先权: JP2003-314909 20030908
- 主分类号: H01J37/26
- IPC分类号: H01J37/26 ; G01N23/04
摘要:
It is possible to reliably and efficiently determine whether a specimen contains viruses, bacteria, etc. and, if it does, identify their types, regardless of the observer. Furthermore, even a newly-discovered bacterium can be quickly identified by utilizing a database at a remote location. A transmission microscope system has a microscope for observing a specimen and a database which stores, for each microscopic thing (such as a virus), a name, a specimen pretreatment method and an imaging condition used when the microscopic thing is observed, captured image data, etc. An image of the specimen is captured according to a specimen pretreatment method and an imaging condition retrieved from the database using the name of a target microscopic thing as a key, and the captured image is compared with images stored in the database to identify microscopic things present in the specimen.
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