发明授权
- 专利标题: Full-wave rectifier for capacitance measurements
- 专利标题(中): 全波整流电容测量
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申请号: US11216754申请日: 2005-08-30
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公开(公告)号: US07046017B1公开(公告)日: 2006-05-16
- 发明人: Robert J. Drost , Ronald Ho , Ivan E. Sutherland
- 申请人: Robert J. Drost , Ronald Ho , Ivan E. Sutherland
- 申请人地址: US CA Santa Clara
- 专利权人: Sun Microsystems, Inc.
- 当前专利权人: Sun Microsystems, Inc.
- 当前专利权人地址: US CA Santa Clara
- 代理机构: Park, Vaughan & Fleming LLP
- 主分类号: G01R27/26
- IPC分类号: G01R27/26 ; G01N27/22
摘要:
One embodiment of the present invention provides an electronic circuit and method for measuring a capacitance. A signal generating mechanism generates a signal having a predefined frequency and predefined low and high voltage levels on one terminal of the capacitance. The other terminal of the capacitance is coupled to a switching mechanism. The switching mechanism is set to couple the other terminal of the capacitance to a first amplifier or a second amplifier for a portion of each signal cycle thereby full-wave rectifying a transient current flowing between the two terminals in the capacitance. Outputs of the first amplifier and the second amplifier are coupled to a current measurement mechanism for measuring the current. The capacitance is determined from the measured current. Several variations on this embodiment are provided.
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