- 专利标题: Fault detection system
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申请号: US10856833申请日: 2004-06-01
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公开(公告)号: US07046155B2公开(公告)日: 2006-05-16
- 发明人: Yutaka Sato , Masahiro Nagasu , Katsumi Ishikawa , Ryuichi Saito , Satoru Inarida
- 申请人: Yutaka Sato , Masahiro Nagasu , Katsumi Ishikawa , Ryuichi Saito , Satoru Inarida
- 申请人地址: JP Tokyo
- 专利权人: Hitachi, Ltd.
- 当前专利权人: Hitachi, Ltd.
- 当前专利权人地址: JP Tokyo
- 代理机构: McDermott Will & Emery LLP
- 优先权: JP2001-323829 20011022
- 主分类号: G08B17/02
- IPC分类号: G08B17/02 ; G08B17/06 ; H02H3/24 ; H02H5/04
摘要:
A fault detection system detecting malfunctions or deteriorations, which may result in an inverter fault, is provided. The system has a temperature sensor installed on a semiconductor module to monitor a temperature rise rate. It is judged that an abnormal condition has occurred if the thermal resistance is increased by the deterioration of a soldering layer of the semiconductor module or by drive circuit malfunctions and, as a result, the relation between an operation mode and the temperature rise rate falls outside a predetermined range.
公开/授权文献
- US20040221217A1 Fault detection system 公开/授权日:2004-11-04
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