Invention Grant
- Patent Title: Apparatus and method for direct measurement of absorption and scattering coefficients in situ
- Patent Title (中): 用于直接测量原位吸收和散射系数的装置和方法
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Application No.: US10715336Application Date: 2003-11-17
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Publication No.: US07057730B2Publication Date: 2006-06-06
- Inventor: Edward S. Fry , George W. Kattawar , Deric J. Gray , Xianzhen Zhao , Zheng Lu
- Applicant: Edward S. Fry , George W. Kattawar , Deric J. Gray , Xianzhen Zhao , Zheng Lu
- Applicant Address: US TX College Station
- Assignee: The Texas A&M University System
- Current Assignee: The Texas A&M University System
- Current Assignee Address: US TX College Station
- Agency: Baker Botts L.L.P.
- Main IPC: G01N21/00
- IPC: G01N21/00

Abstract:
An apparatus for measuring an absorption coefficient includes a first diffusive material, a second diffusive material inside the first diffusive material separated from the first diffusive material by a cavity, and a transparent material proximate to an inner surface of the second diffusive material that holds an absorptive material. First and second light detectors measure light intensities in the first and second diffusive materials respectively. An absorption coefficient for the absorptive material may be determined based on the first and second light intensities measured when the cavity is illuminated by a light source.
Public/Granted literature
- US20040141179A1 Apparatus and method for direct measurement of absorption and scattering coefficients in situ Public/Granted day:2004-07-22
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