Invention Grant
- Patent Title: Method and apparatus for eliminating and compensating thermal transients in gas analyzer
- Patent Title (中): 消除和补偿气体分析仪热瞬变的方法和装置
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Application No.: US10863810Application Date: 2004-06-08
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Publication No.: US07069768B2Publication Date: 2006-07-04
- Inventor: Kurt Weckström , Heikki Haveri , Mika Hietala
- Applicant: Kurt Weckström , Heikki Haveri , Mika Hietala
- Applicant Address: FI Helsinki
- Assignee: Instrumentarium Corp.
- Current Assignee: Instrumentarium Corp.
- Current Assignee Address: FI Helsinki
- Agency: Andrus, Sceales, Starke & Sawall, LLP
- Main IPC: G01N25/00
- IPC: G01N25/00

Abstract:
The invention concerns a gas analyzer comprising: a measuring volume (2), a radiation source (1) for providing a beam to pass said measuring volume; a heat sink (16) for said radiation source; at least one thermal detector (3) having a hot junction within a support structure and receiving the radiation and a cold junction for reference within the same support structure and protected from said radiation; at least one optical bandpass filter (9) between said hot junction and said radiation source; and a thermal mass (11), which is formed of a material having high thermal conductance. The thermal mass has a cavity with a bottom step (34) and a rim (32), and a first length therebetween. The support structure has a frontal edge (35) and a base plate lip (33), and a second length therebetween. There is a radial gap between the thermal mass and the support structure. Press means urge said support structure in the cavity, whereupon a more efficient thermal contact is either between said frontal edge and said bottom step, or between said base plate lip and said rim. A first thermal barrier (17) is between the heat sink and the thermal mass, and a second thermal barrier (22) surrounds the thermal mass. A shield (19) formed of a material having high thermal conductance covers said second thermal barrier and is in thermal contact with said heat sink.
Public/Granted literature
- US20050268690A1 Method and apparatus for eliminating and compensating thermal transients in gas analyzer Public/Granted day:2005-12-08
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