- 专利标题： Apparatus for mass spectrometry on an ion-trap method
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申请号： US10448385申请日： 2003-05-30
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公开(公告)号： US07075069B2公开(公告)日： 2006-07-11
- 发明人: Kiyomi Yoshinari , Yoshiaki Kato , Katsuhiro Nakagawa , Shinji Nagai
- 申请人： Kiyomi Yoshinari , Yoshiaki Kato , Katsuhiro Nakagawa , Shinji Nagai
- 申请人地址： JP Tokyo
- 专利权人： Hitachi, Ltd.
- 当前专利权人： Hitachi, Ltd.
- 当前专利权人地址： JP Tokyo
- 代理机构： Kenyon & Kenyon
- 优先权： JP11-347412 19991207
- 主分类号： H01J49/42
- IPC分类号： H01J49/42
摘要：
Depending on the RF driving voltage amplitude value and the frequency of each frequency component of wideband auxiliary AC voltages, the wideband auxiliary AC voltage comprising plural different frequency components is optimized so that undesired ions having mass-to-charge ratios within the required range will be resonantly ejected from the ion trap electrodes.
公开/授权文献
- US20030205667A1 Apparatus for mass spectrometry on an ion-trap method 公开/授权日：2003-11-06
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