Invention Grant
- Patent Title: Dual ID verification system and switching method therefor
- Patent Title (中): 双ID验证系统及其切换方法
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Application No.: US10655049Application Date: 2003-09-04
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Publication No.: US07077310B2Publication Date: 2006-07-18
- Inventor: Jui-An Shin , Shun-An Chen , Ko-Pin Chang , Hui-Tang Liu , James You
- Applicant: Jui-An Shin , Shun-An Chen , Ko-Pin Chang , Hui-Tang Liu , James You
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: Thomas, Kayden, Horstemeyer & Risley
- Main IPC: G06F17/00
- IPC: G06F17/00
Abstract:
A method for switch dual Id verification systems for installing another carrier ID system on an equipment installation complying with SEMI E87. A first identification access system has internally installed on an equipment installation on which a second identification access system is then installed. Both systems are switched using a control flow and a wafer carrier ID is obtained by the chosen verification system.
Public/Granted literature
- US20050051616A1 Dual ID verification system and switching method therefor Public/Granted day:2005-03-10
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