发明授权
US07102555B2 Boundary-scan circuit used for analog and digital testing of an integrated circuit
有权
用于集成电路模拟和数字测试的边界扫描电路
- 专利标题： Boundary-scan circuit used for analog and digital testing of an integrated circuit
- 专利标题（中）： 用于集成电路模拟和数字测试的边界扫描电路
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申请号： US10837171申请日： 2004-04-30
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公开(公告)号： US07102555B2公开(公告)日： 2006-09-05
- 发明人: Anthony J. Collins , David P. Schultz , Neil G. Jacobson , Edward S. McGettigan , Bradley K. Fross
- 申请人： Anthony J. Collins , David P. Schultz , Neil G. Jacobson , Edward S. McGettigan , Bradley K. Fross
- 申请人地址： US CA San Jose
- 专利权人： Xilinx, Inc.
- 当前专利权人： Xilinx, Inc.
- 当前专利权人地址： US CA San Jose
- 代理商 W. Eric Webostad
- 主分类号： H03M1/10
- IPC分类号： H03M1/10 ; G01R31/28
摘要：
Method and apparatus are described for providing analog capability with boundary-scanning for an integrated circuit. The integrated circuit includes a boundary-scan controller (1517) coupled to an analog-to-digital converter (200). An analog channel is selected for input to the analog-to-digital converter (200). Analog information is converted to digital information by the analog-to-digital converter (200), and then such digital information may be stored in data registers (209) for reading out via the boundary-scan controller (1517).
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