发明授权
- 专利标题: MFIS ferroelectric memory array
- 专利标题(中): MFIS铁电存储器阵列
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申请号: US11262545申请日: 2005-10-28
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公开(公告)号: US07112837B2公开(公告)日: 2006-09-26
- 发明人: Sheng Teng Hsu , Fengyan Zhang , Tingkai Li
- 申请人: Sheng Teng Hsu , Fengyan Zhang , Tingkai Li
- 申请人地址: US WA Camas
- 专利权人: Sharp Laboratories of America, Inc.
- 当前专利权人: Sharp Laboratories of America, Inc.
- 当前专利权人地址: US WA Camas
- 代理机构: Law Office of Gerald Maliszewski
- 代理商 Gerald Maliszewski
- 主分类号: H01L29/76
- IPC分类号: H01L29/76
摘要:
An MFIS memory array having a plurality of MFIS memory transistors with a word line connecting a plurality of MFIS memory transistor gates, wherein all MFIS memory transistors connected to a common word line have a common source, each transistor drain serves as a bit output, and all MFIS channels along a word line are separated by a P+ region and are further joined to a P+ substrate region on an SOI substrate by a P+ region is provided. Also provided are methods of making an MFIS memory array on an SOI substrate; methods of performing a block erase of one or more word lines, and methods of selectively programming a bit.
公开/授权文献
- US20060068509A1 MFIS ferroelectric memory array 公开/授权日:2006-03-30
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