Invention Grant
US07117058B2 Automatic statistical process control (SPC) chart generation apparatus and method thereof
有权
自动统计过程控制(SPC)图生成装置及其方法
- Patent Title: Automatic statistical process control (SPC) chart generation apparatus and method thereof
- Patent Title (中): 自动统计过程控制(SPC)图生成装置及其方法
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Application No.: US10875331Application Date: 2004-06-24
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Publication No.: US07117058B2Publication Date: 2006-10-03
- Inventor: Mu-Tsang Lin , Tien-Wen Wang , Joseph W. L. Fang , Ie-Fun Lai , Chon-Hwa Chu , Jian-Hong Chen , Chin-Chih Chen , Yu-Yi Wu , Yao-Wen Wu , Wen-Sheng Chien
- Applicant: Mu-Tsang Lin , Tien-Wen Wang , Joseph W. L. Fang , Ie-Fun Lai , Chon-Hwa Chu , Jian-Hong Chen , Chin-Chih Chen , Yu-Yi Wu , Yao-Wen Wu , Wen-Sheng Chien
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: Thomas, Kayden, Horstemeyer & Risley
- Main IPC: G06F19/00
- IPC: G06F19/00

Abstract:
A system and method for automatic SPC chart generation including a storage device and a data acquisition module. The storage device stores a chamber management tree, a recipe window management tree, a parameter configuration table and multiple chart profile records. The data acquisition module, which resides in a memory, acquires multiple process events and parameter values corresponding to the process events and a process parameter, selects a relevant statistical algorithm, calculates a statistical value by applying the statistical algorithm to the parameter values, creates a new chart profile record and a parameter statistics record therein if the chart profile record is absent, and stores the statistical values and measured time in the parameter statistics record.
Public/Granted literature
- US20050288810A1 Automatic statistical process control (SPC) chart generation apparatus and method thereof Public/Granted day:2005-12-29
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