发明授权
- 专利标题: Low-temperature silicon nitride deposition
- 专利标题(中): 低温氮化硅沉积
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申请号: US10631627申请日: 2003-07-30
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公开(公告)号: US07125582B2公开(公告)日: 2006-10-24
- 发明人: Michael L. McSwiney , Michael D. Goodner
- 申请人: Michael L. McSwiney , Michael D. Goodner
- 申请人地址: US CA Santa Clara
- 专利权人: Intel Corporation
- 当前专利权人: Intel Corporation
- 当前专利权人地址: US CA Santa Clara
- 代理机构: Blakely, Sokoloff, Taylor & Zafman LLP
- 主分类号: C23C16/00
- IPC分类号: C23C16/00
摘要:
A method including combining a silicon source precursor and a nitrogen source precursor at a temperature up to 550° C.; and forming a silicon nitride film. A system including a chamber; a silicon precursor source coupled to the chamber; a controller configured to control the introduction into the chamber of a silicon precursor from the silicon precursor source; and a memory coupled to the controller comprising a machine-readable medium having a machine-readable program embodied therein for directing operation of the system, the machine-readable program including instructions for controlling the second precursor source to introduce an effective amount of silicon precursor into the chamber at a temperature up to 550° C.
公开/授权文献
- US20050025885A1 Low-temperature silicon nitride deposition 公开/授权日:2005-02-03
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