发明授权
- 专利标题: Soller slit using low density materials
- 专利标题(中): Soller狭缝使用低密度材料
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申请号: US10626630申请日: 2003-07-25
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公开(公告)号: US07127037B2公开(公告)日: 2006-10-24
- 发明人: David Keith Bowen , Ladislav Pina , Adolf Inneman , Stephan Menzer
- 申请人: David Keith Bowen , Ladislav Pina , Adolf Inneman , Stephan Menzer
- 申请人地址: GB Durham
- 专利权人: Bede Scientific Instruments Ltd.
- 当前专利权人: Bede Scientific Instruments Ltd.
- 当前专利权人地址: GB Durham
- 代理机构: Buchanan Ingersoll & Rooney, PC
- 主分类号: G21K1/02
- IPC分类号: G21K1/02 ; G01N23/20
摘要:
A Soller slit device is provided for collimation of high energy radiation, such as X-ray or EUV radiation, and has a low angle of divergence (less than 0.1°) and a high transmission efficiency (60 to 80% or greater). The Soller slit is made up of multiple, parallel blades of low-density material, such as glass, mica, or the like, which can be treated to reduce reflectivity. The Soller slit device of the invention advantageously provides an increased peak intensity and decreased peak width in diffraction patterns produced in high energy diffractometry applications, such as X-ray diffractometry.
公开/授权文献
- US20040131147A1 Soller slit using low density materials 公开/授权日:2004-07-08
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