发明授权
US07158415B2 System for performing fast testing during flash reference cell setting
有权
在闪存参考单元设置期间执行快速测试的系统
- 专利标题： System for performing fast testing during flash reference cell setting
- 专利标题（中）： 在闪存参考单元设置期间执行快速测试的系统
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申请号： US11089268申请日： 2005-03-24
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公开(公告)号： US07158415B2公开(公告)日： 2007-01-02
- 发明人: Lorenzo Bedarida , Simone Bartoli , Stefano Surico , Massimiliano Frulio
- 申请人： Lorenzo Bedarida , Simone Bartoli , Stefano Surico , Massimiliano Frulio
- 申请人地址： US CA San Jose
- 专利权人： Atmel Corporation
- 当前专利权人： Atmel Corporation
- 当前专利权人地址： US CA San Jose
- 代理机构： Schneck & Schneck
- 代理商 Thomas Schneck
- 优先权： ITMI2004A2473 20041223
- 主分类号： G11C16/10
- IPC分类号： G11C16/10
摘要：
An embedded circuit in a memory device is used in place of an external test device to perform time-consuming tasks such as voltage verification during the setting of reference cells. An external test device programs at least one reference cell to a predetermined value. The embedded circuit uses the cell programmed by the external device as a comparative reference to program additional reference cells.
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