Invention Grant
- Patent Title: Probe for testing a device under test
-
Application No.: US10848777Application Date: 2004-05-18
-
Publication No.: US07161363B2Publication Date: 2007-01-09
- Inventor: K. Reed Gleason , Tim Lesher , Eric W. Strid , Mike Andrews , John Martin , John Dunklee , Leonard Hayden , Amr M. E. Safwat
- Applicant: K. Reed Gleason , Tim Lesher , Eric W. Strid , Mike Andrews , John Martin , John Dunklee , Leonard Hayden , Amr M. E. Safwat
- Applicant Address: US OR Beaverton
- Assignee: Cascade Microtech, Inc.
- Current Assignee: Cascade Microtech, Inc.
- Current Assignee Address: US OR Beaverton
- Agency: Chernoff, Vilhauer, McClung & Stenzel
- Main IPC: G01R31/00
- IPC: G01R31/00
Abstract:
A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
Public/Granted literature
- US20040232927A1 Probe for testing a device under test Public/Granted day:2004-11-25
Information query
