Invention Grant
- Patent Title: Identification of an integrated circuit from its physical manufacture parameters
- Patent Title (中): 从其物理制造参数识别集成电路
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Application No.: US10473058Application Date: 2002-04-04
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Publication No.: US07178113B2Publication Date: 2007-02-13
- Inventor: Michel Bardouillet , Luc Wuidart
- Applicant: Michel Bardouillet , Luc Wuidart
- Applicant Address: FR Montrouge
- Assignee: STMicroelectronics S.A.
- Current Assignee: STMicroelectronics S.A.
- Current Assignee Address: FR Montrouge
- Agency: Wolf, Greenfield & Sacks, P.C.
- Agent Lisa K. Jorgenson; James H. Morris
- Priority: FR0104585 20010404
- International Application: PCT/FR02/01192 WO 20020404
- International Announcement: WO02/082448 WO 20021017
- Main IPC: G06F17/50
- IPC: G06F17/50 ; H03K19/173

Abstract:
The invention concerns an identification method and circuit (1) of the network type of parameters contained in an integrated circuit chip, comprising a single input terminal (2) for applying a signal (E) triggering an identification, the output terminals (31, 32, 3i−1, 3i, 3n−1, 3n) adapted to deliver a binary identifying code (B1, B2, Bi−1, Bi, Bn−1, Bn), first electrical paths P1, P2, Pi, Pn), individually connecting said input terminal to each output terminal, and means (4, 51, 52, 5i, 5n) for simultaneously integrating the binary states present in output of the electrical paths, each path inputting a delay sensitive to technological dispersions and/or of the integrated circuit fabrication method.
Public/Granted literature
- US20040125930A1 Identification of an integrated circuit from its physical manufacture parameters Public/Granted day:2004-07-01
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