发明授权
- 专利标题: Automatic exchange of degraders in accelerated testing of computer chips
- 专利标题(中): 自动交换降解器加速电脑芯片测试
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申请号: US10734694申请日: 2003-12-12
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公开(公告)号: US07183758B2公开(公告)日: 2007-02-27
- 发明人: Carl E. Bohnenkamp , Ethan H. Cannon , Ethan W. Cascio , Michael S. Gordon , Kenneth P. Rodbell , Theodore H. Zabel
- 申请人: Carl E. Bohnenkamp , Ethan H. Cannon , Ethan W. Cascio , Michael S. Gordon , Kenneth P. Rodbell , Theodore H. Zabel
- 申请人地址: US NY Armonk
- 专利权人: International Business Machines Corporation
- 当前专利权人: International Business Machines Corporation
- 当前专利权人地址: US NY Armonk
- 代理机构: Ference & Associates
- 主分类号: G01R31/28
- IPC分类号: G01R31/28
摘要:
Issues that are addressed in accordance with at least one presently preferred embodiment of the present invention, are: improvements upon the time it takes to physically swap degraders (done previously by hand); the safety involved in doing so, since the degraders become highly radioactive; possible improved energy resolution and beam stability if the accelerator can be left running continuously; and in-situ monitoring of beam current, beam position and stability. Particularly contemplated are methods and arrangements for changing degraders automatically, not manually, and in a safe manner.
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