发明授权
US07183758B2 Automatic exchange of degraders in accelerated testing of computer chips 失效
自动交换降解器加速电脑芯片测试

Automatic exchange of degraders in accelerated testing of computer chips
摘要:
Issues that are addressed in accordance with at least one presently preferred embodiment of the present invention, are: improvements upon the time it takes to physically swap degraders (done previously by hand); the safety involved in doing so, since the degraders become highly radioactive; possible improved energy resolution and beam stability if the accelerator can be left running continuously; and in-situ monitoring of beam current, beam position and stability. Particularly contemplated are methods and arrangements for changing degraders automatically, not manually, and in a safe manner.
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