发明授权
US07202130B2 Spacer for a split gate flash memory cell and a memory cell employing the same
有权
分离栅闪存单元的间隔器和采用其的存储单元
- 专利标题: Spacer for a split gate flash memory cell and a memory cell employing the same
- 专利标题(中): 分离栅闪存单元的间隔器和采用其的存储单元
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申请号: US10775290申请日: 2004-02-10
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公开(公告)号: US07202130B2公开(公告)日: 2007-04-10
- 发明人: Yuan-Hung Liu , Chih-Ta Wu , Yeur-Luen Tu , Chi-Hsin Lo , Chia-Shiung Tsai
- 申请人: Yuan-Hung Liu , Chih-Ta Wu , Yeur-Luen Tu , Chi-Hsin Lo , Chia-Shiung Tsai
- 申请人地址: TW Hsin-Chu
- 专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人地址: TW Hsin-Chu
- 代理机构: Slater & Matsil, L.L.P.
- 主分类号: H01L21/336
- IPC分类号: H01L21/336 ; H01L29/788
摘要:
A spacer, a split gate flash memory cell, and related method of forming the same. In one aspect, a composite spacer includes a first spacer insulating layer having a first deposition distribution that varies as a function of a location on a substrate. The composite spacer also includes a second spacer insulating layer having a second deposition distribution that varies in substantial opposition to the first deposition distribution. In another aspect, a composite spacer includes a first spacer insulating layer having a substantially uniform deposition distribution across a surface thereof. The composite spacer also includes a second spacer insulating layer having a varying deposition distribution with a thinner composition in selected regions of the memory cell. In another aspect, a coupling spacer provides for a conductive layer that extends between a floating gate and a substrate insulating layer adjacent a source recessed into the substrate of the memory cell.
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