- 专利标题: Substrate processing apparatus and method
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申请号: US10485177申请日: 2002-09-11
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公开(公告)号: US07208076B2公开(公告)日: 2007-04-24
- 发明人: Itsuki Kobata , Mitsuhiko Shirakashi , Masayuki Kumekawa , Takayuki Saito , Yasushi Toma , Tsukuru Suzuki , Kaoru Yamada , Yuji Makita , Hozumi Yasuda
- 申请人: Itsuki Kobata , Mitsuhiko Shirakashi , Masayuki Kumekawa , Takayuki Saito , Yasushi Toma , Tsukuru Suzuki , Kaoru Yamada , Yuji Makita , Hozumi Yasuda
- 申请人地址: JP Tokyo
- 专利权人: Ebara Corporation
- 当前专利权人: Ebara Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: Wenderoth, Lind & Ponack, L.L.P.
- 优先权: JP2001-275112 20010911; JP2002-014132 20020123
- 国际申请: PCT/JP02/09255 WO 20020911
- 国际公布: WO03/030223 WO 20030410
- 主分类号: C25F7/00
- IPC分类号: C25F7/00 ; C25F5/00 ; C25F3/14
摘要:
A substrate processing apparatus can perform an electrolytic processing, which is different from a common, conventional etching, to remove (clean off) a conductive material (film) formed on or adhering to a bevel portion, etc. of a substrate, or process a peripheral portion of a substrate through an electrochemical action. The substrate processing apparatus includes: an electrode section having a plurality of electrodes which are laminated with insulators being interposed, and having a holding portion which is to be opposed to a peripheral portion of a substrate; an ion exchanger disposed in the holding portion of the electrode section; a liquid supply section for supplying a liquid to the holding position of the electrode section; and a power source for applying a voltage to the electrodes of the electrode section so that the electrodes alternately have different polarities.
公开/授权文献
- US20040231989A1 Substrate processing appartus and method 公开/授权日:2004-11-25
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