Invention Grant
US07218127B2 Method and apparatus for probing an electronic device in which movement of probes and/or the electronic device includes a lateral component
失效
用于探测电子设备的方法和装置，其中探针和/或电子设备的移动包括侧向分量
- Patent Title: Method and apparatus for probing an electronic device in which movement of probes and/or the electronic device includes a lateral component
- Patent Title (中): 用于探测电子设备的方法和装置，其中探针和/或电子设备的移动包括侧向分量
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Application No.: US10781369Application Date: 2004-02-18
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Publication No.: US07218127B2Publication Date: 2007-05-15
- Inventor: Timothy E. Cooper , Benjamin N. Eldridge , Igor Y. Khandros , Rod Martens , Gaetan L. Mathieu
- Applicant: Timothy E. Cooper , Benjamin N. Eldridge , Igor Y. Khandros , Rod Martens , Gaetan L. Mathieu
- Applicant Address: US CA Livermore
- Assignee: FormFactor, Inc.
- Current Assignee: FormFactor, Inc.
- Current Assignee Address: US CA Livermore
- Agent N. Kenneth Burraston
- Main IPC: G01R31/02
- IPC: G01R31/02
Abstract:
An electronic device is moved into a first position such that terminals of the electronic device are adjacent probes for making electrical contact with the terminals. The electronic device is then moved horizontally or diagonally such that the terminals contact the probes. Test data are then communicated to and from the electronic device through the probes.
Public/Granted literature
- US20050179455A1 Probing a device Public/Granted day:2005-08-18
Information query
