发明授权
- 专利标题： PICA system timing measurement and calibration
- 专利标题（中）： PICA系统时序测量和校准
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申请号： US10974464申请日： 2004-10-26
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公开(公告)号： US07228464B2公开(公告)日： 2007-06-05
- 发明人: Kenneth R. Wilsher
- 申请人： Kenneth R. Wilsher
- 申请人地址： US CA Milpitas
- 专利权人： Credence Systems Corporation
- 当前专利权人： Credence Systems Corporation
- 当前专利权人地址： US CA Milpitas
- 代理机构： Sughrue Mion, PLLC
- 代理商 Joseph Bach
- 主分类号： G11B20/20
- IPC分类号： G11B20/20 ; G04F10/00 ; G01R35/00
摘要：
PICA probe system apparatus is described, including apparatus for calibrating an event timer having a coarse measurement capability in which time intervals defined by clock boundaries are counted and a fine measurement capability in which time between boundaries is interpolated using a voltage ramp.
公开/授权文献
- US20050160331A1 PICA system timing measurement and calibration 公开/授权日：2005-07-21
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