Invention Grant
- Patent Title: Compactor independent fault diagnosis
- Patent Title (中): 压实机独立故障诊断
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Application No.: US10925230Application Date: 2004-08-23
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Publication No.: US07239978B2Publication Date: 2007-07-03
- Inventor: Wu-Tung Cheng , Kun-Han Tsai , Yu Huang , Nagesh Tamarapalli , Janusz Rajski
- Applicant: Wu-Tung Cheng , Kun-Han Tsai , Yu Huang , Nagesh Tamarapalli , Janusz Rajski
- Agency: Klarquist Sparkman, LLP
- Main IPC: G06F11/30
- IPC: G06F11/30 ; G01R31/28

Abstract:
Methods, apparatus, and systems for performing fault diagnosis are disclosed herein. In certain disclosed embodiments, methods for diagnosing faults from compressed test responses are provided. For example, in one exemplary embodiment, a circuit description of an at least partially scan-based circuit-under-test and a compactor for compacting test responses captured in the circuit-under-test is received. A transformation function performed by the compactor to the test responses captured in the circuit-under-test is determined. A diagnostic procedure for evaluating uncompressed test responses is modified into a modified diagnostic procedure that incorporates the transformation function therein. Computer-readable media comprising computer-executable instructions for causing a computer to perform any of the disclosed methods are also provided. Likewise, computer-readable media comprising lists of fault candidates identified by any of the disclosed methods or circuit descriptions created or modified by the disclosed methods are provided.
Public/Granted literature
- US20050222816A1 Compactor independent fault diagnosis Public/Granted day:2005-10-06
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