发明授权
- 专利标题: Phase-change memory device and method that maintains the resistance of a phase-change material in a reset state within a constant resistance range
- 专利标题(中): 相变存储器件和方法,其将相变材料的电阻维持在恒定电阻范围内的复位状态
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申请号: US10937943申请日: 2004-09-11
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公开(公告)号: US07242605B2公开(公告)日: 2007-07-10
- 发明人: Byung-gil Choi , Woo-yeong Cho , Hyung-rok Oh , Beak-hyung Cho
- 申请人: Byung-gil Choi , Woo-yeong Cho , Hyung-rok Oh , Beak-hyung Cho
- 申请人地址: KR Suwon-si
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR Suwon-si
- 代理机构: F. Chau & Assocs., LLC
- 优先权: KR10-2003-0066504 20030925
- 主分类号: G11C11/00
- IPC分类号: G11C11/00
摘要:
Provided are a phase-change memory device and method that maintains a resistance of a phase-change material in a reset state within a constant resistance range. In the method, data is provided to a first phase-change memory cell and then it is first determined whether data stored in the first phase-change memory cell and the data provided to the first phase-change memory cell are identical. If the data stored in the first phase-change memory cell and the data provided to the first phase-change memory cell are not identical, a complementary write current is provided to the first phase-change memory cell and it is second determined whether the data stored in the first phase-change memory cell and the data provided to the first phase-change memory cell are identical. If the data stored in the first phase-change memory cell and the data provided to the first phase-change memory cell are identical, data is provided to a second phase-change memory cell.
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