Invention Grant
- Patent Title: Method and apparatus for characterization of devices and circuits
- Patent Title (中): 用于表征器件和电路的方法和装置
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Application No.: US11119093Application Date: 2005-04-29
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Publication No.: US07249881B2Publication Date: 2007-07-31
- Inventor: Kevin P. Pipe , Rajeev J. Ram
- Applicant: Kevin P. Pipe , Rajeev J. Ram
- Applicant Address: US MA Cambridge
- Assignee: Massachusetts Institute of Technology
- Current Assignee: Massachusetts Institute of Technology
- Current Assignee Address: US MA Cambridge
- Agency: Daly, Crowley, Mofford & Durkee, LLP
- Main IPC: G01N25/20
- IPC: G01N25/20 ; G01K3/00
Abstract:
A method and apparatus for performing characterization of devices is presented. The characteristic of the device are determined by obtaining a first temperature measurement in a first location of a device, obtaining a second temperature measurement, computing the difference between the temperature measurements and, using the temperatures and/or the temperature difference, a characteristic of the device is determined.
Public/Granted literature
- US20050207469A1 Method and apparatus for characterization of devices and circuits Public/Granted day:2005-09-22
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