发明授权
- 专利标题: Copper interconnects
- 专利标题(中): 铜互连
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申请号: US10797224申请日: 2004-03-10
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公开(公告)号: US07253524B2公开(公告)日: 2007-08-07
- 发明人: Zhen-Cheng Wu , Tzu-Jen Chou , Weng Chang , Yung-Cheng Lu , Syun-Ming Jang , Mong-Song Liang
- 申请人: Zhen-Cheng Wu , Tzu-Jen Chou , Weng Chang , Yung-Cheng Lu , Syun-Ming Jang , Mong-Song Liang
- 申请人地址: TW Hsin-Chu
- 专利权人: Taiwan Semiconductor Manufacturing Co., Ltd.
- 当前专利权人: Taiwan Semiconductor Manufacturing Co., Ltd.
- 当前专利权人地址: TW Hsin-Chu
- 代理机构: Thomas, Layden, Horstemeyer & Risley
- 主分类号: H01L23/48
- IPC分类号: H01L23/48 ; H01L23/52 ; H01L29/40
摘要:
A semiconductor substrate has a first copper layer, on which an etch stop layer and a dielectric layer are successively formed. A second copper layer penetrates the dielectric layer and the etch stop layer to electrically connect to the first metal layer. The etch stop layer has a dielectric constant smaller than 3.5, and the dielectric layer has a dielectric constant smaller than 3.0.
公开/授权文献
- US20050110153A1 Copper interconnects 公开/授权日:2005-05-26
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