Invention Grant
- Patent Title: Method and apparatus for improved sensitivity in a mass spectrometer
- Patent Title (中): 在质谱仪中提高灵敏度的方法和装置
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Application No.: US11315788Application Date: 2005-12-22
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Publication No.: US07259371B2Publication Date: 2007-08-21
- Inventor: Bruce A. Collings , Thomas R. Covey , Mircea Guna , Hassan Javaheri , Alexandre V. Loboda , Bradley B. Schneider , Bruce A. Thomson
- Applicant: Bruce A. Collings , Thomas R. Covey , Mircea Guna , Hassan Javaheri , Alexandre V. Loboda , Bradley B. Schneider , Bruce A. Thomson
- Applicant Address: US MA Framingham CA Concord, Ontario
- Assignee: Applera Corporation,MDS Inc.
- Current Assignee: Applera Corporation,MDS Inc.
- Current Assignee Address: US MA Framingham CA Concord, Ontario
- Agent Andrew T. Karnakis
- Main IPC: H01J49/00
- IPC: H01J49/00

Abstract:
In a mass spectrometer, ions from an ion source pass through an inlet aperture into a vacuum chamber for transmitting prior to mass analysis by the mass analyzer. The configuration of the inlet aperture forms a sonic orifice or sonic nozzle and with a predetermined vacuum chamber pressure, a supersonic free jet expansion is created in the vacuum chamber that entrains the ions within the barrel shock and Mach disc. Once formed, at least one ion guide with a predetermined cross-section to essentially radially confine the supersonic free jet expansion can focus the ions for transmission through the vacuum chamber. This effectively improves the ion transmission between the ion source and the mass analyzer.
Public/Granted literature
- US20060169891A1 Method and apparatus for improved sensitivity in a mass spectrometer Public/Granted day:2006-08-03
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