发明授权
- 专利标题: Method and apparatus for improved sensitivity in a mass spectrometer
- 专利标题(中): 在质谱仪中提高灵敏度的方法和装置
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申请号: US11315788申请日: 2005-12-22
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公开(公告)号: US07259371B2公开(公告)日: 2007-08-21
- 发明人: Bruce A. Collings , Thomas R. Covey , Mircea Guna , Hassan Javaheri , Alexandre V. Loboda , Bradley B. Schneider , Bruce A. Thomson
- 申请人: Bruce A. Collings , Thomas R. Covey , Mircea Guna , Hassan Javaheri , Alexandre V. Loboda , Bradley B. Schneider , Bruce A. Thomson
- 申请人地址: US MA Framingham CA Concord, Ontario
- 专利权人: Applera Corporation,MDS Inc.
- 当前专利权人: Applera Corporation,MDS Inc.
- 当前专利权人地址: US MA Framingham CA Concord, Ontario
- 代理商 Andrew T. Karnakis
- 主分类号: H01J49/00
- IPC分类号: H01J49/00
摘要:
In a mass spectrometer, ions from an ion source pass through an inlet aperture into a vacuum chamber for transmitting prior to mass analysis by the mass analyzer. The configuration of the inlet aperture forms a sonic orifice or sonic nozzle and with a predetermined vacuum chamber pressure, a supersonic free jet expansion is created in the vacuum chamber that entrains the ions within the barrel shock and Mach disc. Once formed, at least one ion guide with a predetermined cross-section to essentially radially confine the supersonic free jet expansion can focus the ions for transmission through the vacuum chamber. This effectively improves the ion transmission between the ion source and the mass analyzer.
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