发明授权
US07302787B2 Defect detection device and bag packaging system equipped with defect detection device
有权
缺陷检测装置和袋装包装系统配备有缺陷检测装置
- 专利标题: Defect detection device and bag packaging system equipped with defect detection device
- 专利标题(中): 缺陷检测装置和袋装包装系统配备有缺陷检测装置
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申请号: US11131355申请日: 2005-05-18
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公开(公告)号: US07302787B2公开(公告)日: 2007-12-04
- 发明人: Seisaku Iwasa , Yuji Yokota , Yuichiro Minakuchi
- 申请人: Seisaku Iwasa , Yuji Yokota , Yuichiro Minakuchi
- 申请人地址: JP Kyoto
- 专利权人: Ishida Co., Ltd.
- 当前专利权人: Ishida Co., Ltd.
- 当前专利权人地址: JP Kyoto
- 代理机构: Global IP Counselors, LLP
- 优先权: JP2004-153522 20040524
- 主分类号: B65B1/30
- IPC分类号: B65B1/30 ; B65B57/02 ; B07C5/10 ; G01N21/00
摘要:
A bag packaging system includes a bag packager and a defect detection device that receives bags manufactured by the bag packager and conveys the bags while checking for defects. The defect detection device includes a first conveyor belt that is arranged below the bag packager, a line sensor that is arranged adjacent to a downstream end of the first conveyor belt, and a controller. The line sensor sends a detection signal when it detects an object that is conveyed by the first conveyor belt. The controller stores the size of a proper bag that is being manufactured. The controller finds a defective bag based on the size of the proper bag, the conveying speed of the first conveyor belt, and duration of the detection signal from the line sensor. The defect detection device can detect defects in bags promptly after the bags are manufactured by the bag packaging machine.
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