发明授权
US07307222B2 Printed circuit board test access point structures and method for making the same 有权
印刷电路板测试接入点结构及其制作方法

Printed circuit board test access point structures and method for making the same
摘要:
A test access point structure for accessing test points of a printed circuit board and method of fabrication thereof is presented. In an x-, y-, z-coordinate system where traces are printed along an x-y plane, the z-dimension is used to implement test access point structures. Each test access point structure is conductively connected to a trace at a test access point directly on top of the trace and along the z axis of the x-, y-, z-coordinate system above an exposed surface of the printed circuit board to be accessible for electrical probing by an external device.
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