Invention Grant
US07307313B2 Semiconductor device including a vertical field effect transistor, having trenches, and a diode
有权
包括具有沟槽的垂直场效应晶体管和二极管的半导体器件
- Patent Title: Semiconductor device including a vertical field effect transistor, having trenches, and a diode
- Patent Title (中): 包括具有沟槽的垂直场效应晶体管和二极管的半导体器件
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Application No.: US11206212Application Date: 2005-08-18
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Publication No.: US07307313B2Publication Date: 2007-12-11
- Inventor: Takasumi Ohyanagi , Atsuo Watanabe , Toshio Sakakibara , Tsuyoshi Yamamoto , Hiroki Nakamura , Rajesh Kumar Malhan
- Applicant: Takasumi Ohyanagi , Atsuo Watanabe , Toshio Sakakibara , Tsuyoshi Yamamoto , Hiroki Nakamura , Rajesh Kumar Malhan
- Applicant Address: JP Tokyo JP Kariya-Shi
- Assignee: Hitachi, Ltd.,Denso Corporation
- Current Assignee: Hitachi, Ltd.,Denso Corporation
- Current Assignee Address: JP Tokyo JP Kariya-Shi
- Agency: Antonelli, Terry, Stout & Kraus, LLP.
- Priority: JP2004-276565 20040924
- Main IPC: H01L29/76
- IPC: H01L29/76

Abstract:
A semiconductor device includes (a) a vertical field effect transistor, the vertical field effect transistor including a drain electrode formed on a first surface of a first conductivity type of a semiconductor, a pair of first trenches formed from a second surface of the semiconductor, control regions of a second conductivity type formed respectively along the first trenches, a source region of the first conductivity type formed along the second surface of the semiconductor between the first trenches, a source electrode joined to the source region, and a gate electrode adjacent to the control regions, (b) a pair of second trenches formed from the second surface of the semiconductor independently of the field effect transistor, (c) control regions of the second conductivity type formed along the second trenches, and (d) a diode having a junction formed on the second surface between the second trenches.
Public/Granted literature
- US20060076613A1 Semiconductor device Public/Granted day:2006-04-13
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