发明授权
- 专利标题: Apparatus and process for detecting inclusions
- 专利标题(中): 用于检测夹杂物的装置和工艺
-
申请号: US11133889申请日: 2005-05-20
-
公开(公告)号: US07307714B2公开(公告)日: 2007-12-11
- 发明人: David G. Cyr , Christopher P. Daigler , David R. Fladd , David C. Jenne , Albert R. Nieber , Nikki Jo Russo , Paul J. Shustack
- 申请人: David G. Cyr , Christopher P. Daigler , David R. Fladd , David C. Jenne , Albert R. Nieber , Nikki Jo Russo , Paul J. Shustack
- 申请人地址: US NY Corning
- 专利权人: Corning Incorporated
- 当前专利权人: Corning Incorporated
- 当前专利权人地址: US NY Corning
- 代理商 Robert P. Santandrea; Siwen Chen
- 主分类号: G01N21/88
- IPC分类号: G01N21/88
摘要:
Disclosed are process and apparatus for inspecting internal inclusions in internally transmissive substrates. The process involves applying a black coating to one major surface of the substrate, submerging the substrate in a refractive index-matching fluid, and scanning the substrate with a collimated light beam. The scattered light signals produced by the inclusions can be detected by the human eye or by using a light detector. By the use of index-matching fluid and the black coating, the signal-to-noise ratio of the process and apparatus are enhanced. A preferred black coating is one cured from an electron beam or photo polymerizable coating composition applied to the major surface. The process and apparatus are particularly suitable for inspecting internal inclusions in an internally transmissive substrate having considerable amount of surface defects or contoured surface that prevent it from inspection in a gas medium.
公开/授权文献
- US20050259247A1 Apparatus and process for detecting inclusions 公开/授权日:2005-11-24
信息查询