发明授权
- 专利标题: Method and apparatus for optical inspection of a display
- 专利标题(中): 用于显示器的光学检查的方法和装置
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申请号: US10771126申请日: 2004-02-02
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公开(公告)号: US07308157B2公开(公告)日: 2007-12-11
- 发明人: Reza Safaee-Rad , Aleksander Crnatovic , Jeffrey Hawthorne , Branko Bukal , Ray Leerentveld
- 申请人: Reza Safaee-Rad , Aleksander Crnatovic , Jeffrey Hawthorne , Branko Bukal , Ray Leerentveld
- 申请人地址: US CA San Jose
- 专利权人: Photon Dynamics, Inc.
- 当前专利权人: Photon Dynamics, Inc.
- 当前专利权人地址: US CA San Jose
- 代理机构: Townsend and Townsend and Crew LLP
- 主分类号: G06K9/32
- IPC分类号: G06K9/32
摘要:
A method and apparatus for optically inspecting a display employs sub-pixel accuracy for each primary color to take into account angle of rotation. The method includes capturing images of a display with R×S sensors; determining sets of sensor coordinates mapping to a pixel, determining multiple misalignment angles between the pixel on the display and the R×S sensors, determining multiple x scaling ratios, determining multiple weighting factors associated with R×S sensors in response to the corresponding multiple misalignment angle and the corresponding multiple x and y scaling ratios, determining multiple luminance values for R×S sensors, determining multiple total luminance values in response to the weighting factors and the luminance values, forming scaled images including first and second luminance values, and inspecting the scaled image to identify potential defects of the pixel on the display.
公开/授权文献
- US20040213449A1 Method and apparatus for optical inspection of a display 公开/授权日:2004-10-28
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