Invention Grant
US07320912B2 Trench capacitors with buried isolation layer formed by an oxidation process and methods for manufacturing the same
有权
通过氧化工艺形成的具有掩埋隔离层的沟槽电容器及其制造方法
- Patent Title: Trench capacitors with buried isolation layer formed by an oxidation process and methods for manufacturing the same
- Patent Title (中): 通过氧化工艺形成的具有掩埋隔离层的沟槽电容器及其制造方法
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Application No.: US11125676Application Date: 2005-05-10
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Publication No.: US07320912B2Publication Date: 2008-01-22
- Inventor: Yueh-Chuan Lee , Ming-Sheng Tung
- Applicant: Yueh-Chuan Lee , Ming-Sheng Tung
- Applicant Address: TW Hsinchu
- Assignee: PROMOS Technologies Inc.
- Current Assignee: PROMOS Technologies Inc.
- Current Assignee Address: TW Hsinchu
- Agency: Akin Gump Strauss Hauer & Feld LLP
- Main IPC: H01L21/8242
- IPC: H01L21/8242

Abstract:
A method for forming a trench capacitor includes: removing a portion of the substrate to form a trench within the substrate; forming at a buried isolation layer within the substrate; forming in the substrate a first electrode of the trench capacitor at least in areas surrounding a lower portion of the trench; forming a dielectric layer of the trench capacitor; and forming a second electrode of the trench capacitor in the trench. The buried isolation layer intersects with the trench and has one or more gaps for providing body contact between a first substrate area above the buried isolation layer and a second substrate area below the buried isolation layer.
Public/Granted literature
- US20060255388A1 Trench capacitors with buried isolation layer and methods for manufacturing the same Public/Granted day:2006-11-16
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