发明授权
- 专利标题: Microscope using quantum-mechanically entangled photons
- 专利标题(中): 显微镜使用量子机械缠结光子
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申请号: US11054441申请日: 2005-02-10
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公开(公告)号: US07321429B2公开(公告)日: 2008-01-22
- 发明人: Kouichi Ichimura , Kenji Ohkuma , Mikio Fujii , Hayato Goto , Kentaro Torii
- 申请人: Kouichi Ichimura , Kenji Ohkuma , Mikio Fujii , Hayato Goto , Kentaro Torii
- 申请人地址: JP Tokyo
- 专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人地址: JP Tokyo
- 代理机构: Oblon, Spivak, McClelland, Maier & Neustadt, P.C.
- 优先权: JP2004-035401 20040212
- 主分类号: G01B9/02
- IPC分类号: G01B9/02
摘要:
A microscope includes a photon source which sequentially generates sets of quantum-mechanically entangled photons including at least two photons, a lens which focuses a set of photons, an actuator which varies a relative distance between a focal position of the lens and a specimen with a minute displacement, a detector detecting photons transmitted through or scattered by the specimen, and a counter counting coincidence detections of n-numbers of photons with the detector during a gating time which is set so that a rate that a number of photons detected during thereof belong to a single set of quantum-mechanically entangled photons exceeds a predetermined rate depending on the varied relative distance.
公开/授权文献
- US20050213107A1 Microscope using quantum-mechanically entangled photons 公开/授权日:2005-09-29
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