- 专利标题: Scanning interferometry for thin film thickness and surface measurements
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申请号: US10974466申请日: 2004-10-27
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公开(公告)号: US07324210B2公开(公告)日: 2008-01-29
- 发明人: Peter J. De Groot , Xavier Colonna De Lega
- 申请人: Peter J. De Groot , Xavier Colonna De Lega
- 申请人地址: US CT Middlefield
- 专利权人: Zygo Corporation
- 当前专利权人: Zygo Corporation
- 当前专利权人地址: US CT Middlefield
- 代理机构: Fish & Richardson P.C.
- 主分类号: G01B11/02
- IPC分类号: G01B11/02
摘要:
A method including: providing a low coherence scanning interferometry data for at least one spatial location of a sample having multiple interfaces, wherein the data is collected using a low coherence scanning interferometer having an illumination geometry and an illumination frequency spectrum, and wherein the data comprises a low coherence scanning interferometry signal having multiple regions of fringe contrast corresponding to the multiple interfaces; and determining a distance between at least one pair of interfaces based on a distance between the corresponding regions of fringe contrast and information about the illumination geometry.
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