Invention Grant
- Patent Title: Stacked 1T-nMTJ MRAM structure
- Patent Title (中): 堆叠1T-nMTJ MRAM结构
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Application No.: US11081652Application Date: 2005-03-17
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Publication No.: US07330367B2Publication Date: 2008-02-12
- Inventor: Hasan Nejad , Mirmajid Seyyedy
- Applicant: Hasan Nejad , Mirmajid Seyyedy
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Dickstein Shapiro LLP
- Main IPC: G11C5/06
- IPC: G11C5/06

Abstract:
This invention relates to MRAM technology and new variations on MRAM array architecture to incorporate certain advantages from both cross-point and 1T-1MTJ architectures. The fast read-time and higher signal-to-noise ratio of the 1T-1MTJ architecture and the higher packing density of the cross-point architecture are both exploited by combining certain characteristics of these layouts. A single access transistor 16 is used to read multiple MRAM cells, which can be stacked vertically above one another in a plurality of MRAM array layers arranged in a “Z” axis direction.
Public/Granted literature
- US20050162898A1 Stacked IT-nMTJ MRAM structure Public/Granted day:2005-07-28
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