发明授权
- 专利标题: Film formation method
- 专利标题(中): 成膜方法
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申请号: US11155575申请日: 2005-06-20
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公开(公告)号: US07344754B2公开(公告)日: 2008-03-18
- 发明人: Hideaki Yamasaki , Tatsuo Hatano , Yumiko Kawano
- 申请人: Hideaki Yamasaki , Tatsuo Hatano , Yumiko Kawano
- 申请人地址: JP Tokyo
- 专利权人: Tokyo Electron Limited
- 当前专利权人: Tokyo Electron Limited
- 当前专利权人地址: JP Tokyo
- 代理机构: Oblon, Spivak, McClelland, Maier & Neustadt, P.C.
- 优先权: JP2002-367073 20021218
- 主分类号: C23C16/00
- IPC分类号: C23C16/00 ; B05D3/00
摘要:
A method of forming a metal film using a metal carbonyl compound as a material is disclosed that includes the steps of: (a) introducing a reactive gas into a space near a surface of a substrate to be processed; and (b) introducing a gaseous phase material including the metal carbonyl compound into the space on the surface of the substrate to be processed, and depositing the metal film on the surface of the substrate to be processed after step (a). Step (a) is executed in such a manner as to prevent substantial deposition of the metal film on the substrate to be processed.
公开/授权文献
- US20050233079A1 Film formation method 公开/授权日:2005-10-20
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