发明授权
- 专利标题: Processing apparatus and method for removing particles therefrom
- 专利标题(中): 用于从中除去颗粒的处理装置和方法
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申请号: US11065359申请日: 2005-02-25
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公开(公告)号: US07347006B2公开(公告)日: 2008-03-25
- 发明人: Tsuyoshi Moriya , Hiroshi Nagaike , Hiroyuki Nakayama , Kikuo Okuyama , Manabu Shimada
- 申请人: Tsuyoshi Moriya , Hiroshi Nagaike , Hiroyuki Nakayama , Kikuo Okuyama , Manabu Shimada
- 申请人地址: JP Tokyo
- 专利权人: Tokyo Electron Limited
- 当前专利权人: Tokyo Electron Limited
- 当前专利权人地址: JP Tokyo
- 代理机构: Oblon, Spivak, McClelland, Maier & Neustadt, P.C.
- 优先权: JP2004-051706 20040226
- 主分类号: F26B5/04
- IPC分类号: F26B5/04
摘要:
A processing apparatus includes a first detection unit for detecting a temperature of an inner wall of the vacuum vessel, a second detection unit for detecting a temperature of the processing unit, and a first control unit for controlling a temperature of the gas. The first control unit controls the temperature of the gas based on a temperature gradient between the temperatures of the inner wall and the gas or a temperature gradient between the temperatures of the processing unit and the gas. A method for removing particles from a processing apparatus includes a first detection step for detecting a temperature of an inner wall of the vacuum vessel, a second detection step for detecting a temperature of the processing unit, a first control step for controlling a temperature of the gas, and a gas introduction step for introducing the gas into the inner space of the vacuum vessel.
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