A test apparatus includes a test module including a correcting unit for correcting the timing at which the test signal is to be supplied to the device under test or a voltage level of the test signal to the device under test, a correction value holding unit for holding a correction value used for a correction by the correcting unit, and an identification information storing unit for storing test module identification information, which is identification information of the test module, a correction value database for storing the correction value to be held by the correction value holding unit of the test module identified by the test module identification information, in order that the correction value corresponds to the test module identification information, and control means for retrieving the correction value stored by the correction value database, wherein the correction value corresponds to the test module identification information stored by the identification information storing unit, and controlling the correction value holding unit to hold the correction value.