Invention Grant
US07353442B2 On-chip and at-speed tester for testing and characterization of different types of memories
有权
用于测试和表征不同类型存储器的片上和高速测试仪
- Patent Title: On-chip and at-speed tester for testing and characterization of different types of memories
- Patent Title (中): 用于测试和表征不同类型存储器的片上和高速测试仪
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Application No.: US11102556Application Date: 2005-04-08
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Publication No.: US07353442B2Publication Date: 2008-04-01
- Inventor: Swapnil Bahl , Balwant Singh
- Applicant: Swapnil Bahl , Balwant Singh
- Applicant Address: IN Uttar Pradesh
- Assignee: STMicroelectronics Pvt. Ltd.
- Current Assignee: STMicroelectronics Pvt. Ltd.
- Current Assignee Address: IN Uttar Pradesh
- Priority: IN695/DEL/2004 20040408
- Main IPC: G01R31/28
- IPC: G01R31/28
Abstract:
An on-chip and at-speed tester for testing and characterization of different types of memories in an integrated circuit device, comprising a Centralized Flow Controller for automatically controlling the test operations for selected test programs, and Localized Signal Generators located inside each memory block and controlled by said Centralized Flow Controller for applying specified test patterns on the associated memory array.
Public/Granted literature
- US20050246602A1 On-chip and at-speed tester for testing and characterization of different types of memories Public/Granted day:2005-11-03
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