Configurable length first-in first-out memory
    1.
    发明申请
    Configurable length first-in first-out memory 有权
    可配置长度先进先出存储器

    公开(公告)号:US20060256636A1

    公开(公告)日:2006-11-16

    申请号:US11394874

    申请日:2006-03-31

    IPC分类号: G11C7/00

    CPC分类号: G06F5/10 G06F2205/063

    摘要: A configurable length first-in first-out (FIFO) memory includes a memory core for storing data, a write address counter connected to the memory core for counting locations for writing the data to be stored, and a read address counter connected to the memory core for counting the locations for reading the stored data. The read address counter includes a comparator for generating a synchronous reset for itself. A selector is connected to the comparator for selecting a user defined FIFO length, or a pre-programmed write address counter length.

    摘要翻译: 可配置长度先进先出(FIFO)存储器包括用于存储数据的存储器核心,连接到存储器核心的写地址计数器,用于计数用于写入要存储的数据的位置,以及连接到存储器的读地址计数器 用于计数读取存储数据的位置的核心。 读地址计数器包括用于自身产生同步复位的比较器。 选择器连接到比较器,用于选择用户定义的FIFO长度,或预编程的写入地址计数器长度。

    On-chip storage memory for storing variable data bits
    2.
    发明申请
    On-chip storage memory for storing variable data bits 有权
    用于存储可变数据位的片上存储器

    公开(公告)号:US20050232028A1

    公开(公告)日:2005-10-20

    申请号:US11102463

    申请日:2005-04-08

    CPC分类号: G06F5/10 G11C7/1006

    摘要: An improved on-chip storage memory and method for storing variable data bits, the memory including an on-chip storage memory system for storing variable data bits that has a memory for storing data bits, a wrapper for converting the memory into a first-in first-out (FIFO) memory, and a controller for performing operations on the memory. In operation, the memory is converted into a FIFO memory after storing data, and output logic selects data to be output in a serial manner.

    摘要翻译: 一种用于存储可变数据位的改进的片上存储器和方法,所述存储器包括用于存储具有用于存储数据位的存储器的可变数据位的片上存储存储器系统,用于将存储器转换为先进先出 先进先出(FIFO)存储器和用于对存储器执行操作的控制器。 在操作中,存储器在存储数据之后被转换为FIFO存储器,并且输出逻辑选择要以串行方式输出的数据。

    Configurable length first-in first-out memory
    3.
    发明授权
    Configurable length first-in first-out memory 有权
    可配置长度先进先出存储器

    公开(公告)号:US07321520B2

    公开(公告)日:2008-01-22

    申请号:US11394874

    申请日:2006-03-31

    IPC分类号: G11C7/00

    CPC分类号: G06F5/10 G06F2205/063

    摘要: A configurable length first-in first-out (FIFO) memory includes a memory core for storing data, a write address counter connected to the memory core for counting locations for writing the data to be stored, and a read address counter connected to the memory core for counting the locations for reading the stored data. The read address counter includes a comparator for generating a synchronous reset for itself. A selector is connected to the comparator for selecting a user defined FIFO length, or a pre-programmed write address counter length.

    摘要翻译: 可配置长度先进先出(FIFO)存储器包括用于存储数据的存储器核心,连接到存储器核心的写地址计数器,用于计数用于写入要存储的数据的位置,以及连接到存储器的读地址计数器 用于计数读取存储数据的位置的核心。 读地址计数器包括用于自身产生同步复位的比较器。 选择器连接到比较器,用于选择用户定义的FIFO长度,或预编程的写入地址计数器长度。

    On-chip storage memory for storing variable data bits
    5.
    发明授权
    On-chip storage memory for storing variable data bits 有权
    用于存储可变数据位的片上存储器

    公开(公告)号:US07372755B2

    公开(公告)日:2008-05-13

    申请号:US11102463

    申请日:2005-04-08

    IPC分类号: G11C7/00

    CPC分类号: G06F5/10 G11C7/1006

    摘要: An improved on-chip storage memory and method for storing variable data bits, the memory including an on-chip storage memory system for storing variable data bits that has a memory for storing data bits, a wrapper for converting the memory into a first-in first-out (FIFO) memory, and a controller for performing operations on the memory. In operation, the memory is converted into a FIFO memory after storing data, and output logic selects data to be output in a serial manner.

    摘要翻译: 一种用于存储可变数据位的改进的片上存储器和方法,所述存储器包括用于存储具有用于存储数据位的存储器的可变数据位的片上存储存储器系统,用于将存储器转换为先进先出 先进先出(FIFO)存储器和用于对存储器执行操作的控制器。 在操作中,存储器在存储数据之后被转换为FIFO存储器,并且输出逻辑选择要以串行方式输出的数据。

    On-chip and at-speed tester for testing and characterization of different types of memories
    6.
    发明授权
    On-chip and at-speed tester for testing and characterization of different types of memories 有权
    用于测试和表征不同类型存储器的片上和高速测试仪

    公开(公告)号:US07353442B2

    公开(公告)日:2008-04-01

    申请号:US11102556

    申请日:2005-04-08

    IPC分类号: G01R31/28

    摘要: An on-chip and at-speed tester for testing and characterization of different types of memories in an integrated circuit device, comprising a Centralized Flow Controller for automatically controlling the test operations for selected test programs, and Localized Signal Generators located inside each memory block and controlled by said Centralized Flow Controller for applying specified test patterns on the associated memory array.

    摘要翻译: 一种用于在集成电路设备中测试和表征不同类型的存储器的片上和速度测试器,包括用于自动控制所选测试程序的测试操作的集中流量控制器和位于每个存储块内的定位信号发生器,以及 由所述集中流量控制器控制,用于在相关联的存储器阵列上应用指定的测试图案。

    Flexible on chip testing circuit for I/O's characterization
    7.
    发明授权
    Flexible on chip testing circuit for I/O's characterization 有权
    用于I / O表征的灵活的片上测试电路

    公开(公告)号:US07772833B2

    公开(公告)日:2010-08-10

    申请号:US12135418

    申请日:2008-06-09

    IPC分类号: G01R31/28

    CPC分类号: G01R31/31715

    摘要: The present invention provides a flexible on-chip testing circuit and methodology for measuring I/O characterization of multiple I/O structures. The testing circuit includes a register bank, a central processing controller (CPC), a character slew module, a delay characterization module, and a character frequency module. The register bank stores multiple instructions, and measurement results. The CPC fetches the instructions from the register bank. The CPC includes various primary and secondary state machines for interpreting the fetched instructions for execution. Depending on the input instruction the CPC applies stimulus to the IUT and the output of the IUT is used by the Local characterization modules (CHARMODULE) to extract the desired characterization parameters such as the character slew module which measures a voltage rise/fall time either for a single voltage IUT or a multi-voltage IUT. The Test Methodology for STIOBISC consists of an automated ATE pattern generation from verification test benches and automated result processing by converting the ATE data logs into the final readable format, thereby considerably reducing the test setup and output processing time. The testing circuit can operate in multiple modes for selecting one of these modules.

    摘要翻译: 本发明提供了用于测量多个I / O结构的I / O表征的灵活的片上测试电路和方法。 测试电路包括寄存器组,中央处理控制器(CPC),字符转换模块,延迟表征模块和字符频率模块。 注册银行存储多个指令和测量结果。 CPC从注册银行取得指示。 CPC包括用于解释获取的指令执行的各种主要和次要状态机。 根据输入指令,CPC对IUT应用激励,IUT的输出由本地表征模块(CHARMODULE)用于提取所需的特性参数,例如测量电压上升/下降时间的字符转换模块, 单电压IUT或多电压IUT。 STIOBISC的测试方法包括通过将ATE数据日志转换为最终可读格式的验证测试台和自动化结果处理的自动ATE模式生成,从而大大降低了测试设置和输出处理时间。 测试电路可以在多种模式下工作,以选择这些模块之一。

    Resolution in measuring the pulse width of digital signals
    8.
    发明授权
    Resolution in measuring the pulse width of digital signals 有权
    分辨率测量数字信号的脉冲宽度

    公开(公告)号:US07516032B2

    公开(公告)日:2009-04-07

    申请号:US10327705

    申请日:2002-12-20

    申请人: Balwant Singh

    发明人: Balwant Singh

    IPC分类号: G06F19/00 G01R29/02 G01R25/08

    摘要: A system and method for providing improved resolution in the measuring the pulse width of digital signals comprising counting the integral number of measuring clock pulses covered by said digital pulse and triggering a chain of cascaded high resolution delay elements from the trailing edge of said measuring clock pulses. Further, the invention measures the delay count obtained from said chain of cascaded delay elements from the trailing edge of the last measuring clock pulse up to the end of said digital pulse, and adds said measured delay count to said integral measuring clock pulse count to obtain the total width of said digital pulse.

    摘要翻译: 一种用于在测量数字信号的脉冲宽度时提供改进的分辨率的系统和方法,包括对由所述数字脉冲覆盖的测量时钟脉冲的整数进行计数,并从所述测量时钟脉冲的后沿触发级联的高分辨率延迟元件链 。 此外,本发明还测量从所述最后测量时钟脉冲的后沿到所述数字脉冲的末端从所述级联延迟元件链获得的延迟计数,并将所述测量的延迟计数加到所述积分测量时钟脉冲计数以获得 所述数字脉冲的总宽度。