发明授权
US07383477B2 Interface circuit for using a low voltage logic tester to test a high voltage IC
失效
使用低电压逻辑测试仪测试高压IC的接口电路
- 专利标题： Interface circuit for using a low voltage logic tester to test a high voltage IC
- 专利标题（中）： 使用低电压逻辑测试仪测试高压IC的接口电路
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申请号： US11194663申请日： 2005-08-02
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公开(公告)号： US07383477B2公开(公告)日： 2008-06-03
- 发明人: Cheng Yung Teng , Yi Chang Hsu
- 申请人： Cheng Yung Teng , Yi Chang Hsu
- 申请人地址： TW Hsin Tien, Taipei County
- 专利权人： Princeton Technology Corporation
- 当前专利权人： Princeton Technology Corporation
- 当前专利权人地址： TW Hsin Tien, Taipei County
- 代理机构： Muncy, Geissler, Olds & Lowe, PLLC
- 主分类号： G01R31/28
- IPC分类号： G01R31/28
摘要：
The present invention provides an interface circuit for using a low voltage logic tester to test a high voltage IC. The interface circuit is between the high voltage IC and the low voltage logic tester, and is used for converting each output of the high voltage IC to a voltage level that the low voltage logic tester can accept, so as to reduce the cost of the testing.
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